Nordson Test & Inspection recently unveiled its Quadra 7 Pro Manual X-Ray Inspection (MXI) system
The Quadra 7 Pro MXI system provides 3D/2D manual inspection with higher resolution for back-end semiconductor applications. The new, advanced Onyx detector technology inside provides lower noise for superior image clarity and faster frame rates. The latest Dual Mode Quadra NT4 tube provides maximum flexibility with two brightness and resolution modes, allowing users to dynamically switch between them, depending on their application needs.
According to Perry Duffill, VP of Nordson, the latest generation QuadraNT4 tube and new Onyx detector are crucial elements of the Quadra 7 Pro MXI. “We’re continuing to advance our hardware and software technology to provide the necessary metrology equipment to address the challenging inspection needs of the semiconductor industry to improve their yields, processes and productivity,” he says.
Coupled with the advanced technology powering the Quadra 7 Pro, the new Revaluation software it uses is designed for high-end semiconductor applications and enables an exceptional user experience with an intuitive interface, optimised workflow and enhanced functionality.