High-power laser diode measurement function

| Information and Communication Technology

Optical spectrum analyser can evaluate pulsed Laser Diode chips

Anritsu has introduced a measurement function for the MS9740B Optical Spectrum Analyser

The function evaluates a pulsed Laser Diode (LD) chip. The product can reduce the test time for pulsed LD chips, contributing to improve production efficiency for high-powered LD chips.

LD chip manufacturers and optical equipment vendors need to evaluate the optical spectrum of the chips during manufacturing. Market demand for high-power LD chips is driven by higher communication bit rates and longer LiDAR detection ranges. In addition, new use cases, such as External Laser Small Pluggable (ELSFP) modules for Co-packaged Optics applications, are expected to accelerate demand. The continuous wave (CW) output from a high-power LD chip suffers power drift and wavelength shift as the chip temperature rises. This is prevented by suppressing the temperature rise by using pulsed LD chips. However, current testing of pulsed LD chips during production takes longer because an external trigger signal is required to synchronise with the pulsed LD chip.

The new, rugged device results in a reduced test time for pulsed LD chips whilst accelerating optical spectrum evaluation by eliminating the need for a trigger signal. It also assures measurement reproducibility of ±1.4 dB for Side Mode Suppression Ratio (SMSR). Low SMSR variation improves the LD chip yield and helps production efficiency.

Jonathan Newell
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