ITC 2016 – International Test Conference

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Date(s) - 15/11/2016 - 17/11/2016
8:30 am - 6:00 pm



The International Test Conference (ITC 2016) event is geared towards the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

Find out more at the ITC 2016 website