5G user equipment test collaboration

NI and Samsung will be at Mobile World Congress demonstrating base station and user equipment interoperability using the 5G NR standard. National I... read more

High channel density lab grade SMU for electronics production

PXI platform source measure unit from NI enables production test equipment in electronics manufacturing to achieve lab grade performance. National ... read more

Low latency 5G communications for V2X

NI and Shanghai University will develop a testbed to focus on achieving low latency 5G communications for vehicle-to-vehicle or infrastructure applica... read more

Charging towards electric mobility

Dr Ben Black, Principal Market Development Manager of Real-Time Test at National Instruments discusses the disruptive technologies associated with veh... read more

Automated test systems on show at Embedded World

NI is attending the Embedded World event this year with its range of products for automated test and measurement. National Instruments (NI) will be... read more