Automated test systems on show at Embedded World

| Environmental Testing

NI is attending the Embedded World event this year with its range of products for automated test and measurement.

National Instruments (NI) will be exhibiting at Embedded World 2018, an international trade fair for embedded systems. The company will be on Stand 108 in Hall 4 at the Nuremberg Exhibition Centre from 27th February until 1st March 2018.

During the event, NI will be showcasing its latest modular, software-centric platforms that accelerate productivity for a wide range of applications in automated test and automated measurement.

More specifically, NI will be demonstrating systems for Hardware-in-the-Loop (HIL) Simulation, Smarter Test for Smart Vehicles, End-of-Line Test, Automated Electronics Test, Time Sensitive Networking, Electromechanical Test and the Industrial Internet of Things (IIoT).

A number of NI employees will be available to discuss the products at the exhibition. Sunaina Kavi, Product Marketing Manager for DAQ & Embedded Product Marketing will deliver a presentation on ‘Measurement and Control Systems Converge: New Technologies to Enable the IIoT’ at 10:00 – 10:30 on Tuesday 27th (Hall 4, Stand 4-428).

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